Multifunction Test System CATE-256FI

The test system CATE-256FI is designed for functional testing and in-circuit testing (MDA) of electronic boards, system units, and mechatronic test specimens. The setup is based on NI PXI modules, which can be individually configured according to application requirements. Due to the modular design, expansions can be implemented quickly and cost-effectively. The system is available as a standalone or inline version. Base Configuration: • 19” rack, 50HE, IP55 • 19“ PXI rack, 4HE, 12 slots • PXI - RT Embedded Controller • PPSU Programmable Power Supply • PSU Fixed Voltage Source • PXI - DMM with 7½ digits • PXI - Function Generator • PXI - Analog Card • PXI - Digital I/O Parallel • PXI - Relay Matrix • PXI - Relay 4x1 MUX • G12 Virginia Panel Test Specimen Interface High-Level Applications: With the appropriate configuration, the test system can also be used in the field of aerospace technology, thus meeting the highest standards.